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SCION 640 VIS-SWIR Camera

SCION 640 VIS–SWIR Camera

The SCION 640 is a high‑sensitivity VIS–SWIR camera designed for applications requiring fast acquisition, low noise, and broad spectral coverage. Featuring a 640 × 512 pixel sensor with 10 µm pixel pitch, the SCION 640 delivers excellent sensitivity across the visible to short‑wave infrared range, enabling reliable detection of both steady‑state and dynamic light events.

With deep thermoelectric cooling and advanced readout modes, the SCION 640 achieves high signal‑to‑noise performance even at long integration times. Its wide wavelength coverage and high frame‑rate capability make the camera well suited for hyperspectral imaging, fluorescence measurements, semiconductor inspection, and scientific spectroscopy. The compact housing and availability of board‑level configurations allow straightforward integration into OEM and system‑level instruments.

Description

SCION 640 VIS–SWIR Camera

The SCION 640 is a high‑sensitivity VIS–SWIR camera designed for applications requiring fast acquisition, low noise, and broad spectral coverage. Featuring a 640 × 512 pixel sensor with 10 µm pixel pitch, the SCION 640 delivers excellent sensitivity across the visible to short‑wave infrared range, enabling reliable detection of both steady‑state and dynamic light events.

With deep thermoelectric cooling and advanced readout modes, the SCION 640 achieves high signal‑to‑noise performance even at long integration times. Its wide wavelength coverage and high frame‑rate capability make the camera well suited for hyperspectral imaging, fluorescence measurements, semiconductor inspection, and scientific spectroscopy. The compact housing and availability of board‑level configurations allow straightforward integration into OEM and system‑level instruments.

Key Specifications

  • Sensor format: 640 × 512 array with 10 µm pixel pitch
  • Spectral range: Broadband VIS–SWIR coverage from approximately 0.4 to 2.5 µm (sensor‑dependent)
  • Cooling: Thermoelectric cooling down to −65 °C
  • Sensitivity: Up to ~85% broadband quantum efficiency using Teledyne VisGaAs or MCT sensor technology
  • Frame rate: Up to 700 fps at full frame, higher rates with windowing
  • Readout modes: Advanced non‑destructive readout and sample‑up‑the‑ramp (SUPR) capability
  • Integration: Compact housing with optional board‑level configuration; compatible with PICAM SDK and LightField software

Specifications

Specifications

Part Number SCION‑VISGAS‑640
Resolution 640 × 512
Max Frame Rate (Standard) 700 Hz
Sensor Model Teledyne VisGaAs
Pixel Size 10 µm
Sensor Type Hybrid CMOS
Shutter Type Global, Rolling
Spectral Range 400–1700 nm
Color / Mono Mono
Lens Mount C‑mount
Data Interface CameraLink, USB 3.0

Features

Acquisition Modes Integrate then read,
Integrate while read,
Sample up the ramp

Performance

Dark Current < 60 e⁻/pixel/second
Full Well Capacity (Qsat) 1 Me⁻ (low gain)
Quantum Efficiency (Mono) 85%
Read Noise < 30 e⁻
Sensor Material InGaAs

Physical

Digitization (ADC) 14‑bit
Dimensions (W × H × L) 86 × 86 × 127 mm
Field of View 6.4 × 5.1 mm

Recommended System Configuration

Accessories (Included) Power supply, USB cable, trigger cables, quick‑start guide

Compliance & Certifications

Certification CE

Scion Camera Comparison

SCION Camera Comparison

Specification SCION 640 VisGaAs SCION 640 MCT SCION VisGaAs 1280
Sensor Resolution 640 × 512 640 × 512 1280 × 1024
Sensor Material VisGaAs (InGaAs) MCT (HgCdTe) VisGaAs (InGaAs)
Pixel Size 10 µm 10 µm 10 µm
Spectral Range ~400 – 1700 nm ~900 – 2500 nm ~400 – 1700 nm
Quantum Efficiency (typ.) Up to ~85% Sensor‑dependent Up to ~85%
Max Frame Rate (Full Frame) Up to 700 fps Up to 700 fps Up to 175 fps
Readout Modes Integrate then read, integrate while read, sample up the ramp (SUPR)
Cooling Thermoelectric cooling down to −65 °C
Shutter Type Global and rolling shutter (sensor‑dependent)
Lens Mount C‑mount
Data Interface CameraLink, USB 3.0 CameraLink, USB 3.0 CameraLink, USB 3.0
Form Factor Compact housing (86 × 86 × 127 mm) or board‑level configuration
Typical Applications Hyperspectral imaging, fluorescence, semiconductor inspection Extended‑SWIR imaging, chemical analysis, defense & astronomy High‑resolution hyperspectral imaging, scientific imaging

Documentation

Download / View Documentation

2026 01 16_TDY Princeton Instruments_Scion_Datasheet_Web

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