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Laser-Interferometric precision instruments for nano-metrology

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Sios MesstechnikThe measurement of lengths, angles, vibrations and other measured categories is done with the highest resolution and precision in cojunction with beneficial properties for users in areas of engineering, optics and semiconductor industries, in the calibration and metrology field, in research and development and many other application areas.

The flexible structure of SIOS allows individual adaptations to customer request and varying measuring conditions.

Interferometry

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Product image(s)

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Enquiry

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