Laser Interferometric Instruments for Ultra-Precise Nano-Metrology

Experience unmatched precision in nano-scale measurement with our laser-interferometric instruments—engineered for high-resolution metrology applications across research, calibration, and advanced industrial environments.

SIOS delivers ultra-high-resolution and precision measurements of lengths, angles, vibrations, and more—empowering users across engineering, optics, and semiconductor industries, as well as calibration, metrology, research & development, and many other fields.

Thanks to its flexible design, SIOS systems can be individually adapted to meet specific customer requirements and diverse measurement conditions.

• Length measurement systems
• Combined lenght- and angle measurement systems 
• Vibration measurement systems
• Calibration rigs and nano-measuring machines
• Frequency stabilized HeNe lasers

Enquiry